METHODS OF ATOMIC FORCE MICROSCOPY AND PROFILOMETRY IN THE STUDY OF FRACTAL HETEROGENEITY SEALED SURFACES

UDC 676.017

 

Gromyko Irina Grigor’yevna – PhD (Engineering), Associate Professor, Head of the Department of Printing Production. Belarusian State Technological University (13a, Sverdlova str., 220006, Minsk, Republic of Belarus). E-mail: gromyko@belstu.by

Kudryashova Alina Nikolaevna – Master’s degree student, the Department of Printing Production. Belarusian State Technological University (13a, Sverdlova str., 220006, Minsk, Republic of Belarus). E-mail: kudryashova@belstu.by

Prokhorchik Sergey Aleksandrovich – Dean of the Faculty of Correspondence Education, PhD (Engineering), Assistant Professor, the Department of Technology and Design of Wood Products. Belarusian State Technological University (13a, Sverdlova str., 220006, Minsk, Republic of Belarus). E-mail: prohorchyk@belstu.by Babakhanova Khalima Abishevna – DSc (Engineering), Professor, the Department of Technology of Printing and Packaging Processes. Tashkent Institute of Textile and Light Industry (5, Shokhzhakhon str., 100100, Tashkent, Republic of Uzbekistan). E-mail: halima300@inbox.ru

Galimova Zulfiya Kamilovna – PhD (Engineering), Assistant Professor, the Department of Technology of Printing and Packaging Processes. Tashkent Institute of Textile and Light Industry (5, Shokhzhakhon str., 100100, Tashkent, Republic of Uzbekistan). E-mail: z.galimova8282@mail.ru

 

DOI: https://doi.org/10.52065/2520-6729-2024-279-1.

 

Key words: roughness, microstructure, atomic force microscopy, profilometry, fractal dimension.

For citation: Gromyko I. G., Kudryashova A. N., Prokhorchik S. A., Babakhanova Kh. A., Galimova Z. K. Methods of atomic force microscopy and profilometry in the study of fractal heterogeneity sealed surfaces. Proceedings of BSTU, issue 4, Print- and Mediatechnologies, 2024, no. 1 (279), pp. 5–12 (In Russian). DOI: 10.52065/2520-6729-2024-279-1.

 

Abstract

The article presents a comparative analysis of atomic force microscopy and profilometry methods in the study of fractal heterogeneity of sealed materials. The use of the Solver HV scanning probe microscope operating in semi-contact mode and the Hommel Tester T1000 profilometer-profilograph made it possible to obtain profilograms of the surface relief of paper samples. Four paper samples with different composition compositions were used as the object of the study. The parameters of the surface roughness of paper samples obtained using an atomic force microscope and a profilometer are given, and the fractal dimensions of the paper structure are calculated. The research methods used allow them to be equally used to assess the stochastic structure of the sealed surfaces, although the atomic force microscopy method is more accurate, while the profilometer transmits only the general contour of the relief. When using atomic force microscopy, a topographic image of the surface of paper samples for a frame of 3500 nm provides more accurate results. The approaches used will allow us to take into account the contribution of the material structure to the distribution of the paint layer, which will ultimately have an impact on the quality of printed products.

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15.01.2024